SIGiST Conference 2008

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Opening Words, Alon Linetzki, SIGiST Israel Chair

Dear SIGiST members, colleagues, honorable guests, ladies and gentleman.

 

It is with great pleasure that I welcome you to join SIGiST Israel Conference 2008. We had a great year for the testing forum, a year with new and different people joining in to the community, a year with great professional meetings, and a year that is conveying a message – SIGiST Israel is giving professionals a different perspective, and the community is gaining knowledge.

 

In 2008, we are starting the WGs new scheme (announced on March event), launching the Testing News letter, building up a new SIGiST Israel website, and adding a few more surprises to us the testing community.

 

On the international arena, we have signed cooperation agreements with a few SIG communities around the world, among them ASQF (Germany), iSQI (Germany) and a few more are on the way. It means that we get benefits on the events planned by these interest groups, and you as members get the same benefits as their members, and vice versa.

 

This year, we diversified the international team of the conference a little bit, and invited Vipul Kocher, from India, to give a visionary keynote, we have Mieke Geverse, from Belgium, to train us on her long years professional work on performance and load (with hands on examples using a real performance and load tool), and Anne Mette, from Denmark, who is the president of the iNTCCM (international configuration management certification board), is coming to give first course and certification about the topic. Of course Bernard Homes, from France,

 

Presentations days are with very high quality, presenters are with a lot of experience, and that means we are expecting the best testing conference ever!

 

I would like to call all those who are not members yet of this great community, to take a good decision and join in – come and share your experiences, get together with other testers and test managers, and keep yourself updated in all the hot testing issues around the year.

 

Last but not least, let me thank SIGiST main sponsors this year, ITCB and SELA Group. They have helped making this event very professional and attractive to us in SIGiST Israel and to all the testing community. A special thank you to Yan Baron, Program Chair, and Debi Zylbermann, WGs Leader (and the new SIGiST Israel executive board member) that are on the board with me, working hard for preparing this SIG event and the rest of the activities for the community.

 

‘Test’ the conference out, it is your profession and obligation.

 

                                                                                                                                                 Alon Linetzki

                                                                                                                                                SIGiST Israel Chair

 

                                                                       

 

Dear Conference guests and speakers,

 

I am very happy to announce that the Israel International SW Test Conference has become our tradition, and I am proud to present to you the 2008 Conference program.

 

The great success of the First Israel International SW Test Conference last year compels us to have an even better conference this year.

Meeting this expectation is a big challenge, but I believe we have successfully accomplished this goal, and you will really enjoy participating in the tutorials, keynotes and track presentations delivered by leading experts from Israeli and International companies.

 

The program represents the main ideas, trends and achievements of our Israel testing society, and demonstrates the high level of testing in Israel.

  

This conference will be another significant contribution from SiGIST and ITCB to our main mission – to continually improve the professional level of Israeli software testing.

 

I’m looking forward to seeing more and more Israeli test experts joining our Conference, year after year.

                                        

                                                                                                                                                 Yan Baron

                                                                                                                                                Program Chair

     

Conference Structure

 

The Conference is opened to all interested parties but holds special discounted rates for SIGiST members, you may choose to attend the pre-conference tutorial sessions, conference presentations or enjoy the full SIGiST 2008 Conference experience.

 

For registration please click here    

 

 

 

The presenting tracks of these year conference are:

·         Test Management

·         Test Design & Techniques

·         Test Methodology

·         Test Process Improvement

·         Test Metrics

·         Test Automation & Tools

 

In addition, leading vendors will present recent developments in special Key note sessions

 

For more information please visit the following pages:

 

Tutorial Information

 

Presentation Information


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